Skip to main navigation Skip to search Skip to main content

Laplace Residual Power Series Solutions of the Fractional Modified KdV System with Physical Applications

  • Moa’ath N. Oqielat*
  • , Tareq Eriqat
  • , Zeyad Al-Zhour
  • , Ahmad El-Ajou
  • , Zaid Odibat
  • *Corresponding author for this work
  • Al-Balqa Applied University

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper, we construct approximate series solutions for the general fractional modified KdV system (MKdV-S) in Caputo’s sense using a new analytical technique called the Laplace residual power series method (L-RPSM). The main advantage of our new technique is that it provides better accuracy and faster convergence of series solutions compared to other methods, and it requires a few computations for finding the coefficients of terms of series solutions by using only the concept of limit at infinity without involving discretization, perturbation, or any other physical restriction conditions. In addition, two attractive physical applications coming from fractional MKdV-S are given and examined by making a comparison between our obtained results for solving the fractional MKdV-S by L-RPSM, and other well-known methods such as the variational iteration method (VIM), Adomian decomposition method (ADM), q-homotopy analysis transform method (q-HATM), and homotopy analysis method (HAM). Finally, several attractive numerical tests and graphical results are also given and discussed.

Original languageEnglish
Article number12
JournalInternational Journal of Applied and Computational Mathematics
Volume11
Issue number1
DOIs
StatePublished - Feb 2025

Keywords

  • Caputo’s fractional operator
  • Fractional partial differential equations
  • Laplace-residual power series method
  • Modified KdV system
  • Multivariable function

Fingerprint

Dive into the research topics of 'Laplace Residual Power Series Solutions of the Fractional Modified KdV System with Physical Applications'. Together they form a unique fingerprint.

Cite this